Phys. Rev. Lett. 110, 135506 (2013)
W. Paul, Y. Miyahara, and P. Grütter
J. Vac. Sci. Technol. A 31, 023201 (2013)
D. J. Oliver, J. Maassen, M. El Ouali, W. Paul, T. Hagedorn, Y. Miyahara, Y. Qi, H. Guo, and P. Grütter
"Conductivity of an atomically defined metallic interface"
Proc. Natl. Acad. Sci. U. S. A. 109, 19097 (2012); doi:10.1073/pnas.1208699109
A. Labuda, M. Lysy, W. Paul, Y. Miyahara, P. Grütter, R. Bennewitz,
and M. Sutton
Stochastic noise in atomic force microscopy
Physical
Review E 86, 033104 (2012)
W. Paul, Y. Miyahara, and P. Grütter
Implementation of
atomically defined field ion microscopy tips in scanning probe microscopy
Nanotechnology 23, 335702 (2012)
B. Drevniok, W. Paul, K. R. Hairsine, and A. B. Mclean
Methods
and instrumentation for piezoelectric motors
Review of Scientific
Instruments 83, 033706 (2012)
T. Hagedorn, M. El Ouali, W. Paul, D. Oliver, Y. Miyahara, and P.
Grütter
Refined tip preparation by electrochemical etching and ultrahigh
vacuum treatment to obtain atomically sharp tips for scanning tunneling
microscope and atomic force microscope
Review of Scientific
Instruments 82, 113903 (2011)
J.-B. Lalanne, W. Paul, D. Oliver, and P. H. Grütter
Note:
Electrochemical etching of sharp iridium tips
Review of Scientific
Instruments 82, 116105 (2011).
A. Labuda, T. Brastaviceanu, I. Pavlov, W. Paul, and D. E. Rassier
Optical
detection system for probing cantilever deflections parallel to a sample
surface
Review of Scientific Instruments 82, 013701 (2011)
A. Labuda, W. Paul, B. Pietrobon, R. B. Lennox, P. H. Grütter, and
R. Bennewitz
High-resolution friction force microscopy under
electrochemical control
Review of Scientific Instruments 81, 083701
(2010).
T. Filleter, W. Paul, and R. Bennewitz
Atomic structure and
friction of ultrathin films of KBr on Cu(100)
Physical Review B 77,
035430 (2008).