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W. PaulD. OliverY. Miyahara, and P. Grütter   
Phys. Rev. Lett. 110, 135506 (2013)

W. Paul, Y. Miyahara, and P. Grütter  
J. Vac. Sci. Technol. A 31, 023201 (2013) 

D. J. Oliver, J. Maassen, M. El Ouali, W. Paul, T. Hagedorn, Y. Miyahara, Y. Qi, H. Guo, and P. Grütter
"Conductivity of an atomically defined metallic interface"  
Proc. Natl. Acad. Sci. U. S. A. 109, 19097 (2012); doi:10.1073/pnas.1208699109

A. Labuda, M. Lysy, W. Paul, Y. Miyahara, P. Grütter, R. Bennewitz, and M. Sutton
Stochastic noise in atomic force microscopy
Physical Review E 86, 033104 (2012)

W. Paul, Y. Miyahara, and P. Grütter
Implementation of atomically defined field ion microscopy tips in scanning probe microscopy
Nanotechnology 23, 335702 (2012)

B. Drevniok, W. Paul, K. R. Hairsine, and A. B. Mclean
Methods and instrumentation for piezoelectric motors
Review of Scientific Instruments 83, 033706 (2012)

T. Hagedorn, M. El Ouali, W. Paul, D. Oliver, Y. Miyahara, and P. Grütter
Refined tip preparation by electrochemical etching and ultrahigh vacuum treatment to obtain atomically sharp tips for scanning tunneling microscope and atomic force microscope
Review of Scientific Instruments 82, 113903 (2011)

J.-B. Lalanne, W. Paul, D. Oliver, and P. H. Grütter
Note: Electrochemical etching of sharp iridium tips
Review of Scientific Instruments 82, 116105 (2011).

A. Labuda, T. Brastaviceanu, I. Pavlov, W. Paul, and D. E. Rassier
Optical detection system for probing cantilever deflections parallel to a sample surface
Review of Scientific Instruments 82, 013701 (2011)

A. Labuda, W. Paul, B. Pietrobon, R. B. Lennox, P. H. Grütter, and R. Bennewitz
High-resolution friction force microscopy under electrochemical control
Review of Scientific Instruments 81, 083701 (2010).

T. Filleter, W. Paul, and R. Bennewitz
Atomic structure and friction of ultrathin films of KBr on Cu(100)
Physical Review B 77, 035430 (2008).